| Patents for G21K 7 - Gamma ray or x-ray microscopes (1,690) |
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| 03/17/2005 | US20050056783 Object inspection and/or modification system and method |
| 03/09/2005 | EP1511994A2 Element-specific x-ray fluorescence microscope and method of operation |
| 03/02/2005 | EP1509941A2 Low-pressure chamber for scanning electron microscopy in a wet environment |
| 03/02/2005 | EP1509761A2 Methods for sem inspection of fluid containing samples |
| 02/22/2005 | US6859516 Method for examining structures on a semiconductor substrate |
| 02/22/2005 | US6858845 Scanning electron microscope |
| 02/22/2005 | US6858843 Immersion objective lens for e-beam inspection |
| 02/17/2005 | WO2005014784A2 System for molecular imaging |
| 02/15/2005 | US6855945 Electrically conductive synthetic diamond apertures for electron and other particulate beam systems |
| 02/15/2005 | US6855931 Scanning electron microscope and sample observation method using the same |
| 02/08/2005 | US6853143 Electron beam system and method of manufacturing devices using the system |
| 02/08/2005 | US6852973 Scanning charged particle microscope |
| 02/01/2005 | US6850598 X-ray anode and process for its manufacture |
| 02/01/2005 | US6849844 2-D microscopic tomographic systems utilizing 2-D deflection sensors |
| 01/27/2005 | WO2005008707A2 Improved tip for nanoscanning electron microscope |
| 01/27/2005 | WO2005008681A1 Devices for guiding and manipulating electron beams |
| 01/19/2005 | CN1185911C Liquid droplet mist generating method and apparatus, mask-alignment for ultraviolet light source and substrate |
| 01/18/2005 | US6844963 Double-resonance-absorption microscope |
| 01/18/2005 | US6844551 Method of determining lattice constant, method of evaluating material by using the same and electronic microscope suitable for using the same |
| 01/11/2005 | US6841788 Transmission electron microscope sample preparation |
| 01/11/2005 | US6841775 Electron microscope |
| 01/06/2005 | US20050001178 Multi-column charged particle optics assembly |
| 12/30/2004 | US20040267471 Lithography tool image quality evaluating and correcting |
| 12/30/2004 | US20040265907 Juxtaposing affinity moieties to a semiconductor to effect changes in the charge pair separation characteristics when the affinity molecules are bound to the target; detecting target moieties in situ using nanocrystalline semiconductors; genome sequencing, forensics, assays, and drug screening |
| 12/30/2004 | US20040265209 reacting the single-wall carbon nanotubes with a compound that provides at least one substituent, such as peptides or amino acids |
| 12/30/2004 | US20040264637 Multifrequency ultra-high resolution miniature scanning microscope using microchannel and solid-state sensor technologies and method for scanning samples |
| 12/29/2004 | EP1492129A1 X-ray image magnifying device |
| 12/29/2004 | CN1558780A Composites comprising superabsorbent materials having a bimodal particle size distribution and methods of making the same |
| 12/28/2004 | US6836373 Spherical aberration corrector for electron microscope |
| 12/23/2004 | US20040256554 Photoelectric current multiplier using molecular crystal and production method therefor |
| 12/16/2004 | US20040252875 System and method for data management in a linear-array-based microscope slide scanner |
| 12/16/2004 | US20040251428 Charged-particle-beam mapping projection-optical systems and methods for adjusting same |
| 12/09/2004 | US20040245466 Transmission electron microscope sample preparation |
| 12/02/2004 | WO2004105077A1 High-density recording scanning microscope |
| 12/01/2004 | EP1482520A1 X-ray microscope |
| 11/30/2004 | US6824755 Method for producing a catalyst support and compositions thereof |
| 11/25/2004 | US20040234106 Method and apparatus for providing nanoscale dimensions to SEM (Scanning Electron Microscopy) or other nanoscopic images |
| 11/25/2004 | DE10319269A1 Abbildungssystem für ein, auf extrem ultravioletter (EUV) Strahlung basierendem Mikroskop Imaging system for a turn based extreme ultraviolet (EUV) radiation microscope |
| 11/23/2004 | US6822245 Ion beam apparatus and sample processing method |
| 11/18/2004 | US20040227077 Electron microscopes exhibiting improved imaging of specimen having chargeable bodies |
| 11/16/2004 | US6818902 Positron source |
| 11/11/2004 | DE19934987B4 Röntgenanode und ihre Verwendung X-ray anode and their use |
| 11/10/2004 | CN1175430C High resolution X-ray imaging of extra fine objects |
| 11/09/2004 | US6815688 Devices for guiding and manipulating electron beams |
| 11/09/2004 | US6815677 Scanning electron microscope and method of controlling the same |
| 11/04/2004 | US20040217297 Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope |
| 11/04/2004 | US20040217287 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus |
| 11/03/2004 | EP1230828B1 Method for obtaining an extreme ultraviolet radiation source and its use in lithography |
| 10/28/2004 | US20040212891 Imaging system for an extreme ultraviolet (EUV) beam-based microscope |
| 10/28/2004 | US20040211899 Sample electrification measurement method and charged particle beam apparatus |
| 10/27/2004 | EP1471539A1 Imaging system for microscope based on extreme ultraviolet (EUV) radiation |
| 10/26/2004 | US6809306 Scanning unit and scanning microscope having the same |
| 10/21/2004 | US20040208280 X-ray microscopic inspection apparatus |
| 10/21/2004 | US20040206903 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 10/12/2004 | US6803573 Scanning electron microscope |
| 10/07/2004 | US20040195525 Apparatus and method for reducing the electron-beam-induced deposition of contamination products |
| 10/07/2004 | US20040195506 Electron holography method |
| 10/07/2004 | DE10313644A1 Vorrichtung und Verfahren zum Reduzieren der elektronenstrahlinduzierten Abscheidung von Kontaminationsprodukten Apparatus and method for reducing the electron beam induced deposition of contamination products |
| 10/05/2004 | US6800865 Adhering nanotubes to be used as probe needles to electrode in protruding fashion, adhering base end of nanotube to surface of holder with tip end protruding, irradiating with electron beam to fasten nanotube to holder with coating film |
| 09/30/2004 | US20040188635 Electron beam apparatus with aberration corrector |
| 09/30/2004 | US20040188612 Scanning electron microscope |
| 09/23/2004 | US20040183016 Scanning electron microscope and sample observation method using the same |
| 09/23/2004 | US20040183014 Scanning electron microscope |
| 09/22/2004 | EP1459327A1 Scanning x-ray microscope with a plurality of simultaneous x-ray probes on the sample |
| 09/16/2004 | US20040178353 Positron source |
| 09/08/2004 | EP1455365A2 Reflective X-ray microscope and inspection system for examining objects with wavelengths 100nm |
| 09/07/2004 | US6787772 Scanning electron microscope |
| 09/07/2004 | US6786393 Pinhole disk laminate and a process for producing the same |
| 09/02/2004 | US20040170312 Fully automatic rapid microscope slide scanner |
| 09/02/2004 | US20040168527 Coated nanotube surface signal probe |
| 08/26/2004 | WO2004053920A8 Humidified imaging with an environmental scanning electron microscope |
| 08/19/2004 | US20040159786 Method of fabricating probe for scanning probe microscope |
| 08/18/2004 | EP1446813A2 Reflective x-ray microscope and inspection system for examining objects with wavelengths of= 100nm |
| 08/17/2004 | US6777676 X-ray scanning |
| 08/05/2004 | US20040149906 Method and apparatus for reducing substrate edge effects in electron lenses |
| 07/27/2004 | US6768114 Electron microscope, method for operating the same, and computer-readable medium |
| 07/27/2004 | US6767696 Positioning carrier on one side of exposure mask whose exposure section correlates to tip to be produced, applying photostructurable material, exposing from opposite side, hardening, removing unexposed material, separating carrier |
| 07/20/2004 | US6765217 Charged-particle-beam mapping projection-optical systems and methods for adjusting same |
| 07/20/2004 | US6765205 Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same |
| 07/07/2004 | CN1511332A Device and method ofr examination of samples in non-vacuum environment using scanning electron microscope |
| 07/01/2004 | US20040125442 Phase contrast microscope for short wavelength radiation and imaging method |
| 06/29/2004 | US6756026 Catalytic end to end connecting of single wall nanotubes using gaseous carbon |
| 06/29/2004 | US6756025 Injecting particle suspension containing attached catalysts into evaporation zone producing nanoparticle stream then introducing carbonaceous feedstock gas |
| 06/24/2004 | WO2004053920A2 Humidified imaging with an environmental scanning electron microscope |
| 06/24/2004 | WO2003030955A8 Composites comprising superabsorbent materials having a bimodal particle size distribution and methods of making the same |
| 06/24/2004 | CA2507056A1 Humidified imaging with an environmental scanning electron microscope |
| 06/22/2004 | US6753518 Electron beam exposure or system inspection or measurement apparatus and its method and height detection apparatus |
| 06/22/2004 | US6753194 Surface contamination analyzer for semiconductor wafers, method used therein and process for fabricating semiconductor device |
| 06/10/2004 | US20040108459 Electron microscope, method for operating the same, and computer-readable medium |
| 06/10/2004 | US20040108458 Focused ion beam system with coaxial scanning electron microscope |
| 06/03/2004 | DE10250893A1 Verfahren und Vorrichtung zum Bestimmen der Abmessung eines Strukturelements durch Variieren eines die Auflösung bestimmenden Parameters Method and apparatus for determining the dimension of a structural element by varying a parameter determining the resolution |
| 05/27/2004 | US20040099805 Electron microscope including apparatus for x-ray analysis and method of analyzing specimens using same |
| 05/26/2004 | EP0974149A4 High resolution x-ray imaging of very small objects |
| 05/25/2004 | US6740877 Scanning electron microscope and sample observation method using the same |
| 05/21/2004 | WO2003096356A3 Reflective x-ray microscope and inspection system for examining objects with wavelengths of≤ 100nm |
| 05/21/2004 | WO2003030955A3 Composites comprising superabsorbent materials having a bimodal particle size distribution and methods of making the same |
| 05/20/2004 | US20040094714 Method of determining lattice constant, method of evaluating material by using the same and electronic microscope suitable for using the same |
| 05/20/2004 | US20040094713 Scanning electron microscope |
| 05/20/2004 | US20040094711 Non-contact scanning apparatus using frequency response separation scheme and scanning method thereof |
| 05/06/2004 | US20040084620 Lens for a scanning electron microscope |