| Patents for G21K 7 - Gamma ray or x-ray microscopes (1,690) |
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| 08/09/2007 | US20070181806 Charged particle optical apparatus with aberration corrector |
| 08/09/2007 | US20070181805 Scanning electron microscope having a monochromator |
| 08/09/2007 | CA2640572A1 Process and apparatus for imaging |
| 08/07/2007 | US7253901 Laser-based cleaning device for film analysis tool |
| 08/07/2007 | US7253418 Device and method for the examination of samples in a non vacuum environment using a scanning electron microscope |
| 08/07/2007 | US7253409 Electrochemical nano-patterning using ionic conductors |
| 08/02/2007 | US20070176103 Method and device for observing a specimen in a field of view of an electron microscope |
| 08/02/2007 | US20070176102 Particle optical apparatus with a predetermined final vacuum pressure |
| 07/26/2007 | US20070170358 Scanning electron microscope |
| 07/19/2007 | US20070164219 Charged particle beam apparatus and methods for capturing images using the same |
| 07/19/2007 | US20070164218 SEM technique for imaging and measuring electronic transport in nanocomposites based on electric field induced contrast |
| 07/19/2007 | US20070164217 Projection electron microscope, electron microscope, specimen surface observing method and micro device producing method |
| 07/17/2007 | US7245696 Element-specific X-ray fluorescence microscope and method of operation |
| 07/17/2007 | US7244949 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements |
| 07/12/2007 | US20070158568 Apparatus and measuring method of aberration coefficient of scanning transmission electron microscope |
| 07/12/2007 | US20070158567 Apparatus and adjusting method for a scanning transmission electron microscope |
| 07/12/2007 | US20070158566 Method for creating observational sample |
| 07/12/2007 | US20070158565 Electron beam apparatus and device manufacturing method using the same |
| 07/12/2007 | US20070158564 Method and apparatus for processing a micro sample |
| 07/12/2007 | US20070158563 Charged-particle beam instrument |
| 07/12/2007 | US20070158562 Three-dimensional imaging using electron beam activated chemical etch |
| 07/12/2007 | US20070158561 Single stage charged particle beam energy width reduction system for charged particle beam system |
| 07/12/2007 | US20070158560 Charged particle beam system, semiconductor inspection system, and method of machining sample |
| 07/12/2007 | US20070158559 Scanning probe apparatus |
| 07/12/2007 | US20070158558 Ion sources, systems and methods |
| 07/12/2007 | US20070158557 Ion sources, systems and methods |
| 07/12/2007 | US20070158556 Ion sources, systems and methods |
| 07/12/2007 | US20070158554 Probe for probe microscope using transparent substrate, method of producing the same, and probe microscope device |
| 07/12/2007 | US20070158553 Dynamics bionems sensors and arrays of bionems sensor immersed in fluids |
| 07/10/2007 | US7241995 Electron microscope equipped with magnetic microprobe |
| 07/10/2007 | US7241987 Probe for near-field microscope, the method for manufacturing the probe and scanning probe microscope using the probe |
| 07/05/2007 | US20070152150 Charged particle beam apparatus |
| 07/03/2007 | US7239686 Method and arrangement for producing radiation |
| 06/28/2007 | US20070145270 Method and apparatus of reviewing defects on a semiconductor device |
| 06/28/2007 | US20070145269 Electron anti-fogging baffle used as a detector |
| 06/28/2007 | US20070145268 Ultra-thin liquid control plate and combination of box-like member and the control plate |
| 06/28/2007 | US20070145267 Portable scanning electron microscope |
| 06/28/2007 | US20070145266 Electron microscope apparatus using CRT-type optics |
| 06/28/2007 | US20070145265 Method of scanning |
| 06/26/2007 | US7236651 Image evaluation method and microscope |
| 06/26/2007 | US7235784 Transmission electron microscope and image observation method using it |
| 06/21/2007 | WO2007070475A2 Scanning electron microscope with crt-type electron optics |
| 06/21/2007 | WO2006113933A3 Scintillator-based micro-radiographic imaging device |
| 06/21/2007 | US20070138390 Inspection method and inspection system using charged particle beam |
| 06/19/2007 | US7232996 Method and an apparatus of an inspection system using an electron beam |
| 06/19/2007 | US7232995 Method of removing particle of photomask using atomic force microscope |
| 06/12/2007 | US7230243 Method and apparatus for measuring three-dimensional shape of specimen by using SEM |
| 06/12/2007 | US7230242 Methods for SEM inspection of fluid containing samples |
| 06/07/2007 | US20070125948 Method of measuring a critical dimension of a semiconductor device and a related apparatus |
| 06/07/2007 | US20070125947 Sample enclosure for a scanning electron microscope and methods of use thereof |
| 06/07/2007 | US20070125946 Y-shaped carbon nanotubes as afm probe for analyzing substrates with angled topography |
| 06/05/2007 | US7227144 Scanning transmission electron microscope and scanning transmission electron microscopy |
| 06/05/2007 | US7227143 X-ray detecting devices and apparatus for analyzing a sample using the same |
| 05/31/2007 | US20070120056 Method and apparatus for evaluating pattern shape of a semiconductor device |
| 05/24/2007 | US20070114410 Testing method for semiconductor device, testing apparatus therefor, and semiconductor device suitable for the test |
| 05/24/2007 | US20070114409 Electron beam apparatus with aberration corrector |
| 05/24/2007 | US20070114408 Charged-particle beam system |
| 05/24/2007 | US20070114407 Particle detection auditing system and method |
| 05/24/2007 | US20070114406 Scanning probe in pulsed-force mode, digital and in real time |
| 05/24/2007 | US20070114405 Tool-to-tool matching control method and its system for scanning electron microscope |
| 05/24/2007 | US20070114404 Method and system for detecting hidden defects |
| 05/24/2007 | US20070114403 Electron microscope |
| 05/24/2007 | US20070114402 Object inspection and/or modification system and method |
| 05/24/2007 | US20070114401 Direct write nanolithography using heated tip |
| 05/24/2007 | US20070114400 Probe |
| 05/24/2007 | US20070114399 Pattern measuring method |
| 05/24/2007 | DE102005056404A1 Röntgenmikroskop mit Kondensor-Monochromator-Anordnung hoher spektraler Auflösung X-ray microscope with condenser-monochromator arrangement of high spectral resolution |
| 05/22/2007 | US7221731 X-ray microscopic inspection apparatus |
| 05/22/2007 | US7220986 Photoelectric current multiplier using molecular crystal and production method therefor |
| 05/22/2007 | US7220973 Modular manipulation system for manipulating a sample under study with a microscope |
| 05/22/2007 | US7219538 Balanced momentum probe holder |
| 05/15/2007 | US7218703 X-ray microscopic inspection apparatus |
| 05/15/2007 | US7217925 Scanning electron microscope |
| 05/10/2007 | WO2005065090A3 Techniques for building-scale electrostatic tomography |
| 05/09/2007 | EP1782435A2 Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope |
| 05/08/2007 | US7214938 Sample observation method and transmission electron microscope |
| 05/08/2007 | US7214937 Electron microscope |
| 05/01/2007 | US7212017 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus |
| 05/01/2007 | US7211805 Liquid metal ion gun |
| 05/01/2007 | US7211804 Chromatic aberration corrector for charged particles and charged-particle optical apparatus using the corrector |
| 05/01/2007 | US7211797 Inspection method and inspection system using charged particle beam |
| 05/01/2007 | US7211795 Method for manufacturing single wall carbon nanotube tips |
| 04/24/2007 | US7209596 Method of precision calibration of a microscope and the like |
| 04/19/2007 | WO2007044696A1 Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration |
| 04/19/2007 | WO2007016484A3 X-ray imaging systems employing point-focusing, curved monochromating optics |
| 04/19/2007 | WO2007016484A2 X-ray imaging systems employing point-focusing, curved monochromating optics |
| 04/19/2007 | WO2006083650A3 A method of determining the cuticle scale height of fibers |
| 04/19/2007 | US20070085007 Charged particle beam device with DF-STEM image valuation method |
| 04/19/2007 | US20070085006 Pattern observation apparatus, pattern observation method, method of manufacturing semiconductor device, and program |
| 04/19/2007 | US20070085005 Pattern defect inspection method and apparatus thereof |
| 04/19/2007 | US20070085004 Substrate-examining apparatus |
| 04/19/2007 | US20070085003 Electron beam applying apparatus and drawing apparatus |
| 04/19/2007 | CA2624926A1 Multi-reflecting time-of-flight mass spectrometer with orthogonal acceleration |
| 04/17/2007 | US7205560 Method and apparatus for processing a micro sample |
| 04/17/2007 | US7205555 Defect inspection apparatus and defect inspection method |
| 04/17/2007 | US7205540 Electron beam apparatus and device manufacturing method using same |
| 04/12/2007 | US20070080291 Cluster tool for microscopic processing of samples |
| 04/11/2007 | CN1310025C Manufacturing method for test apparatus and parts |
| 04/10/2007 | US7202951 Laser-based cleaning device for film analysis tool |
| 04/10/2007 | US7202476 Charged-particle beam instrument |