| Patents for G21K 7 - Gamma ray or x-ray microscopes (1,690) |
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| 05/06/2004 | US20040084619 Method and an apparatus for determining the dimension of a feature by varying a resolution determining parameter |
| 05/06/2004 | US20040084618 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 04/29/2004 | WO2004015448A3 Mission-specific positron emission tomography |
| 04/29/2004 | US20040079892 Tip for nanoscanning electron microscope |
| 04/29/2004 | US20040079884 Converting scanning electron microscopes |
| 04/15/2004 | WO2003104847A3 Low-pressure chamber for scanning electron microscopy in a wet environment |
| 04/15/2004 | WO2003104846A3 A sample enclosure for a scanning electron microscope and methods of use thereof |
| 04/13/2004 | US6720558 Transmission electron microscope equipped with energy filter |
| 04/08/2004 | US20040065827 Method for the electron-microscopic observation of a semiconductor arrangement and apparatus therefor |
| 04/08/2004 | US20040065819 Scanning unit and scanning microscope having the same |
| 04/06/2004 | US6717145 Mapping electron microscopes exhibiting improved imaging of specimen having chargeable bodies |
| 04/01/2004 | US20040062352 Laser plasma X-ray generating apparatus |
| 04/01/2004 | US20040062347 X-ray microscope |
| 04/01/2004 | US20040061051 Devices for guiding and manipulating electron beams |
| 03/31/2004 | EP0927331B1 Macroscopically manipulable nanoscale devices made from nanotube assemblies |
| 03/30/2004 | US6713761 Scanning electron microscope |
| 03/25/2004 | US20040056193 Applications operating with beams of charged particles |
| 03/23/2004 | US6711283 Fully automatic rapid microscope slide scanner |
| 03/23/2004 | US6710339 Scanning probe microscope |
| 03/18/2004 | WO2003102564A3 Element-specific x-ray fluorescence microscope using multiple imaging systems comprising a zone plate |
| 03/11/2004 | US20040046120 Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope |
| 03/04/2004 | US20040041095 Methods and apparatus for electron beam inspection of samples |
| 02/26/2004 | WO2003104848A3 Methods for sem inspection of fluid containing samples |
| 02/19/2004 | WO2004015448A2 Mission-specific positron emission tomography |
| 02/19/2004 | US20040031921 Electron microscope |
| 02/19/2004 | CA2495215A1 Mission-specific positron emission tomography |
| 02/12/2004 | US20040028272 Pattern inspection method and apparatus using electron beam |
| 02/12/2004 | US20040026621 Particle detectors |
| 02/12/2004 | US20040026620 Mission-specific positron emission tomography |
| 02/11/2004 | EP1388883A2 Coaxial FIB-SEM column |
| 02/05/2004 | US20040021075 Method of measuring sizes in scan microscopes |
| 02/05/2004 | US20040021074 Scanning charged particle microscope |
| 02/05/2004 | DE10232689A1 Mit Strahlen geladener Teilchen arbeitende Anwendungen With charged particle beams working applications |
| 01/29/2004 | US20040016882 Scanning electron microscope |
| 01/29/2004 | DE10230929A1 Verfahren zum elektronenmikroskopischen Beobachten einer Halbleiteranordnung und Vorrichtung hierfür A method for electron microscopic observation of a semiconductor device and apparatus therefor |
| 01/28/2004 | EP1385192A2 Device working with beams of charged particles |
| 01/28/2004 | CN1136587C Holographic X-ray Microscope with preamplification |
| 01/15/2004 | WO2004005906A1 A method for detection of micrometric and sub-micrometric images by means of irradiation of a mask or of a biological specimen with ionizing radiation |
| 01/15/2004 | CA2504195A1 A method for detection of micrometric and sub-micrometric images by means of irradiation of a mask or of a biological specimen with ionizing radiation |
| 01/14/2004 | EP1381074A2 Method and apparatus for observing a semiconductor device using an electron microscope |
| 01/13/2004 | US6677606 Dopa and dopamine modification of metal oxide semiconductors, method for attaching biological molecules to semiconductors |
| 01/13/2004 | US6677585 Scanning charged particle microscope, and focal distance adjusting method and astigmatism correction method thereof |
| 01/08/2004 | US20040005026 X-ray microscope apparatus |
| 01/07/2004 | CN1466860A Method and apparatus for generating X-ray or EUV radiation |
| 01/06/2004 | US6674077 Microelectromechanical system assembly and testing device |
| 01/06/2004 | US6674076 Humidified imaging with an environmental scanning electron microscope |
| 12/23/2003 | US6668040 Refractive X-ray arrangement |
| 12/23/2003 | US6667830 Super-resolution microscope system and method for illumination |
| 12/23/2003 | US6667483 Apparatus using charged particle beam |
| 12/18/2003 | WO2003104848A2 Methods for sem inspection of fluid containing samples |
| 12/18/2003 | WO2003104847A2 Low-pressure chamber for scanning electron microscopy in a wet environment |
| 12/18/2003 | WO2003104846A2 A sample enclosure for a scanning electron microscope and methods of use thereof |
| 12/11/2003 | WO2003102564A2 Element-specific x-ray fluorescence microscope using multiple imaging systems comprising a zone plate |
| 12/09/2003 | US6661008 Electron-optical system and inspection method using the same |
| 12/09/2003 | US6661004 Image deconvolution techniques for probe scanning apparatus |
| 12/04/2003 | US20030223536 Element-specific X-ray fluorescence microscope and method of operation |
| 12/03/2003 | EP1367630A2 Improvements in or relating to particle detectors |
| 12/02/2003 | US6657213 High temperature EUV source nozzle |
| 11/27/2003 | US20030219097 X-ray microscope having an X-ray source for soft X-ray |
| 11/27/2003 | US20030218132 Scanning probe microscope |
| 11/20/2003 | WO2003096764A1 Method and arrangement for producing radiation |
| 11/20/2003 | WO2003096356A2 Reflective x-ray microscope and inspection system for examining objects with wavelengths of≤ 100nm |
| 11/20/2003 | US20030213893 Electron beam apparatus and device manufacturing method using same |
| 11/11/2003 | US6647088 Production of a dense mist of micrometric droplets in particular for extreme UV lithography |
| 10/30/2003 | US20030201393 Electron microscope |
| 10/28/2003 | US6639219 Electron scatter in a thin membrane to eliminate detector saturation |
| 10/21/2003 | US6635874 Self-cleaning technique for contamination on calibration sample in SEM |
| 10/21/2003 | US6635870 Method and apparatus for molecular analysis of buried layers |
| 10/16/2003 | US20030193026 Electron microscope, method for operating the same, and computer-readable medium |
| 10/09/2003 | US20030189172 Scanning electron microscope and sample observation method using the same |
| 10/07/2003 | US6630668 Remote control of a scanning electron microscope aperture and gun alignment |
| 10/02/2003 | WO2003081605A1 X-ray image magnifying device |
| 09/30/2003 | US6627888 Scanning electron microscope |
| 09/12/2003 | WO2003075286A1 X-ray microscope |
| 09/10/2003 | EP1342049A1 Scanning probe with digitised pulsed-force mode operation and real-time evaluation |
| 09/09/2003 | US6617761 Scanning unit and scanning microscope having the same |
| 09/09/2003 | US6617580 Electron holography microscope |
| 09/03/2003 | EP1340241A1 Device and method for the examination of samples in a non-vacuum environment using a scanning electron microscope |
| 09/02/2003 | US6614022 Pattern inspection method and apparatus using electron beam |
| 08/26/2003 | US6610980 Apparatus for inspection of semiconductor wafers and masks using a low energy electron microscope with two illuminating beams |
| 08/21/2003 | US20030155509 Electron beam system and method of manufacturing devices using the system |
| 08/19/2003 | US6608308 Electrostatic lens systems for secondary-electron mapping-projection apparatus, and mapping-projection apparatus and methods comprising same |
| 08/19/2003 | US6608305 Selective deposition of a particle beam based on charging characteristics of a sample |
| 08/14/2003 | US20030150990 Atomic force microscopy, method of measuring surface configuration using the same, and method of producing magnetic recording medium |
| 08/13/2003 | EP1335640A2 Plasma-type X-ray source encased in vacuum chamber exhibiting reduced heating of interior components, and microlithography systems comprising same |
| 08/07/2003 | US20030147499 Plasma-type X-ray generators encased in vacuum chambers exhibiting reduced heating of interior components, and microlithography systems comprising same |
| 07/29/2003 | US6600156 Scanning electron microscope |
| 07/22/2003 | US6596993 Method of automatically correcting magnification and non-linearity of scanning electron microscope |
| 07/10/2003 | US20030129914 Composites comprising superabsorbent materials having a bimodal particle size distribution and methods of making the same |
| 07/08/2003 | US6590703 Optical system for scanning microscope |
| 07/08/2003 | US6590212 Microelectromechanical system assembly and testing device |
| 07/03/2003 | WO2003054890A1 Scanning x-ray microscope with a plurality of simultaneous x-ray probes on the sample |
| 07/03/2003 | US20030122075 Design for an electron holography microscope |
| 07/03/2003 | US20030122073 Coated nanotube surface signal probe and method of attaching nanotube to probe holder |
| 07/01/2003 | US6586737 Transmission electron microscope equipped with energy filter |
| 06/12/2003 | US20030108155 X-ray micro-target source |
| 06/12/2003 | US20030106998 Method for producing boron nitride coatings and fibers and compositions thereof |
| 06/11/2003 | EP1317685A2 Fully automatic rapid microscope slide scanner |
| 06/10/2003 | US6576902 Correction method of scanning electron microscope |
| 06/03/2003 | US6573501 Holography transmission electron microscope |